
Operational Excellence through Statistical Thinking


Our approach aims to structure and systematize how impact is questioned and evaluated. Without this rigor, traditional hypothesis testing often provides limited value: it may suggest potential improvement paths, but the true impact only becomes visible after implementation. Meanwhile, more impactful opportunities may be overlooked due to the lack of upstream evaluation.
Statoscopex Study
Statoscopex performs comprehensive capability studies, estimating key statistical parameters such as mean, standard deviation, occurrence rate, and proportion.

Capability Study
Statoscopex performs full capability analysis by estimating mean, standard deviation, occurrence rate, and proportion in a single view.
Continuous Metric
Counting metric
Binary metric
Study of The Average
Dedicated module for precise analysis, hypothesis testing, and detection of shifts or effects on the process mean.
Average estimate
Useful effect
Detection of an effect
Detection of a deviation from a target
Study of The Standard Deviation
Tools focused on variability: study, test, and detect changes or deviations from the expected standard deviation.
Estimation of the standard deviation
Useful effect
Detection of an effect
Detection of a deviation from a target
Study of the Rate of Occurrence
Analyzes count-based or event rates, detects deviations from a target rate, and estimates occurrence parameters with power calculation.
Estimating the rate of occurrence
Useful effect
Detection of an effect
Detection of a deviation from a target
Study of the Proportion
Specialized analysis of binary outcomes or proportions, including deviation detection, confidence intervals, and effect size evaluation.
Estimating the proportion
Useful effect
Detection of an effect
Detection of a deviation from a target
Advanced Features for Your Statistical Studies
Statoscopex offers more than50 analyses and 100 statistical calculations through its capability study and factor analysis functionalities, including:
Capability Study
For the following metrics: continuous, counting, binary.
- Determining the statistical accuracy of the defect rate of a process
- Determining the minimum sample size required to estimate the defect rate of a process
Estimation of the statistical parameter
For the following parameters: mean, standard deviation, rate of occurrence, proportion.
- Determining the confidence interval of the parameter
- Determining the minimum sample size required to estimate the statistical parameter with a certain accuracy
Useful effect
For the following parameters: mean, standard deviation, rate of occurrence, proportion.
- Translation of the objective of reducing the defect rate in terms of the target effect on the statistical parameter.
- Determination of the minimum sample size required to detect the effect on the statistical parameter that achieves the objective of reducing the defect rate.
Detection of an effect
For the following parameters: mean, standard deviation, rate of occurrence, proportion.
- Detect the existence of an effect below or above a threshold value
- Determine the minimum sample size required to detect an effect at least equal to a certain size
- Determine the smallest detectable effect using two samples (resolution)
- Determine the detection power of an effect below or above a threshold value, using samples.
Techniques used: two-sample t-test, two-variance test, two-sample Poisson test, two-proportion test
Detection of a deviation from a target
For the following parameters: mean, standard deviation, rate of occurrence, proportion.
- Detect if a parameter differs from its reference value
- Determine the minimum sample size required to detect if a parameter differs from its reference value
- Determine the smallest detectable difference between the value of a parameter and its reference value, using a sample (resolution)
- Determine the detection power of a parameter’s deviation from its reference value, using a sample
Techniques used: one-sample t-test, variance test, one-sample Poisson test, proportion test.
